Thickness measurement of soft thin films on periodically patterned magnetic substrates by phase difference magnetic force microscopy

Francesco Ciccarello, Marianecci, Pantanella, Berlutti, Passeri, Natalizi, Rossi, Dong, Angeloni

Risultato della ricerca: Article

14 Citazioni (Scopus)
Lingua originaleEnglish
pagine (da-a)96-106
Numero di pagine11
RivistaUltramicroscopy
Volume136
Stato di pubblicazionePublished - 2014

All Science Journal Classification (ASJC) codes

  • Atomic and Molecular Physics, and Optics
  • Electronic, Optical and Magnetic Materials
  • Instrumentation

Cita questo

Thickness measurement of soft thin films on periodically patterned magnetic substrates by phase difference magnetic force microscopy. / Ciccarello, Francesco; Marianecci; Pantanella; Berlutti; Passeri; Natalizi; Rossi; Dong; Angeloni.

In: Ultramicroscopy, Vol. 136, 2014, pag. 96-106.

Risultato della ricerca: Article

Ciccarello, F, Marianecci, Pantanella, Berlutti, Passeri, Natalizi, Rossi, Dong & Angeloni 2014, 'Thickness measurement of soft thin films on periodically patterned magnetic substrates by phase difference magnetic force microscopy', Ultramicroscopy, vol. 136, pagg. 96-106.
Ciccarello, Francesco ; Marianecci ; Pantanella ; Berlutti ; Passeri ; Natalizi ; Rossi ; Dong ; Angeloni. / Thickness measurement of soft thin films on periodically patterned magnetic substrates by phase difference magnetic force microscopy. In: Ultramicroscopy. 2014 ; Vol. 136. pagg. 96-106.
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AU - Passeri, null

AU - Natalizi, null

AU - Rossi, null

AU - Dong, null

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