Thermoelastic signal processing using an FFT lock-in based algorithm on extended sampled data

Leonardo D'Acquisto, Giuseppe Pitarresi, Antonino Marco Siddiolo

Risultato della ricerca: Conference contribution

Abstract

A fast infrared scanner is used to acquire the thermoelastic effect induced temperature changes along a line on the surface of cyclically loaded tensile samples. The raster scanning movement of the single detector allows the sampling of temperature versus time. This data are then post-processed by means of a lock-in algorithm coupled with 1D and 2D FFT analyses in order to filter out the thermoelastic signal from the noisy measured signal. A data extension algorithm is proposed which uses the information from different acquired frames to extend the data sampling window. The whole signal processing setup is evaluated on experimental data with successful results, proposing a potential tool for low cost Thermoelastic Stress Analysis
Lingua originaleEnglish
Titolo della pubblicazione ospiteXIX IMEKO WORLD CONGRESS: FUNDAMENTAL AND APPLIED METROLOGY, PROCEEDINGS
Pagine865-870
Numero di pagine6
Stato di pubblicazionePublished - 2009

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

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