Testing the outflow theory of Malcherek by slit weir data

Vito Ferro, Ismail Aydin

Risultato della ricerca: Article

6 Citazioni (Scopus)

Abstract

In this paper the flow-process of a slit weir is analyzed by the outflow theory of Malcherek. Average flow velocity over the slit weir is expressed in terms of head over weir and the momentum correction coefficient. The theoretically deduced stage-discharge formula was then calibrated using experimental data obtained for a ratio between the weir and the channel width ranging from 0.05 to 0.25. The deduced stage–discharge relationship allows to measure discharge values characterized by errors which are, for 91% of the measured values, less than or equal to ± 5%.
Lingua originaleEnglish
pagine (da-a)114-117
Numero di pagine4
RivistaFlow Measurement and Instrumentation
Volume59
Stato di pubblicazionePublished - 2018

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Flow velocity
slits
Momentum
Testing
Less than or equal to
Experimental Data
Coefficient
flow velocity
momentum
coefficients
Relationships

All Science Journal Classification (ASJC) codes

  • Modelling and Simulation
  • Electrical and Electronic Engineering
  • Computer Science Applications
  • Instrumentation

Cita questo

Testing the outflow theory of Malcherek by slit weir data. / Ferro, Vito; Aydin, Ismail.

In: Flow Measurement and Instrumentation, Vol. 59, 2018, pag. 114-117.

Risultato della ricerca: Article

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AB - In this paper the flow-process of a slit weir is analyzed by the outflow theory of Malcherek. Average flow velocity over the slit weir is expressed in terms of head over weir and the momentum correction coefficient. The theoretically deduced stage-discharge formula was then calibrated using experimental data obtained for a ratio between the weir and the channel width ranging from 0.05 to 0.25. The deduced stage–discharge relationship allows to measure discharge values characterized by errors which are, for 91% of the measured values, less than or equal to ± 5%.

KW - Dimensional analysis; Discharge measurements; Slit weirs; Modeling and Simulation; Instrumentation; Computer Science Applications1707 Computer Vision and Pattern Recognition; Electrical and Electronic Engineering

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