Structural modifications induced by electron irradiation in SiO2 glass: Local densification measurements

Simonpietro Agnello; Gianpiero Buscarino; Franco Mario Gelardi

Structural modifications induced by electron irradiation in SiO2 glass: Local densification measurements

Simonpietro Agnello, Gianpiero Buscarino, Franco Mario Gelardi

Fisica e Chimica - Emilio Segrè

Risultato della ricerca: Article › peer review

Lingua originale	English
pagine (da-a)	26007-p1-26007-p4
Numero di pagine	4
Rivista	Europhysics Letters
Volume	2009-08-18
Stato di pubblicazione	Published - 2009

All Science Journal Classification (ASJC) codes

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@article{cbc693e8aaaa4949be3f96983e5871c7,

title = "Structural modifications induced by electron irradiation in SiO2 glass: Local densification measurements",

keywords = "Electron and positron radiation eﬀects, Glasses, Point defects and defect clusters, Electron and positron radiation eﬀects, Glasses, Point defects and defect clusters",

author = "Simonpietro Agnello and Gianpiero Buscarino and Gelardi, {Franco Mario}",

year = "2009",

language = "English",

volume = "2009-08-18",

pages = "26007--p1--26007--p4",

journal = "Europhysics Letters",

issn = "0295-5075",

publisher = "IOP Publishing Ltd.",

}

TY - JOUR

T1 - Structural modifications induced by electron irradiation in SiO2 glass: Local densification measurements

AU - Agnello, Simonpietro

AU - Buscarino, Gianpiero

AU - Gelardi, Franco Mario

PY - 2009

Y1 - 2009

KW - Electron and positron radiation eﬀects

KW - Glasses

KW - Point defects and defect clusters

KW - Electron and positron radiation eﬀects

KW - Glasses

KW - Point defects and defect clusters

UR - http://hdl.handle.net/10447/44506

M3 - Article

VL - 2009-08-18

SP - 26007-p1-26007-p4

JO - Europhysics Letters

JF - Europhysics Letters

SN - 0295-5075

ER -