Semiconductor electrochemistry approach to passivity and passivity breakdown of metals and metallic alloys

Francesco Di Quarto, Monica Santamaria, Santamaria, Di Quarto

Risultato della ricerca: Article

31 Citazioni (Scopus)

Abstract

A critical appraisal of the use of the theory of semiconductors in characterising passive films on metals and alloys is provided, with special emphasis on the use of Mott – Schottky theory for the location of characteristic energy levels of the passive film – electrolyte junction. Some inconsistencies between theory and experimental results in the case of thin passive films are discussed together with possible alternative ways for overcoming such problems. The role of semiconducting properties in determining the pitting behaviour of passive films on W in solutions containing halide is presented and discussed. The validity of a recently proposed correlation between the solid state properties of passive films and the pitting potential is critically reviewed.
Lingua originaleEnglish
pagine (da-a)71-81
Numero di pagine11
RivistaBritish Corrosion Journal
Volume39
Stato di pubblicazionePublished - 2004

Fingerprint

Electrochemistry
Metals
Semiconductor materials
Pitting
Electron energy levels
Electrolytes

All Science Journal Classification (ASJC) codes

  • Chemistry(all)
  • Materials Science(all)
  • Chemical Engineering(all)

Cita questo

@article{f1e62b84310d4408848e29267252ff00,
title = "Semiconductor electrochemistry approach to passivity and passivity breakdown of metals and metallic alloys",
abstract = "A critical appraisal of the use of the theory of semiconductors in characterising passive films on metals and alloys is provided, with special emphasis on the use of Mott – Schottky theory for the location of characteristic energy levels of the passive film – electrolyte junction. Some inconsistencies between theory and experimental results in the case of thin passive films are discussed together with possible alternative ways for overcoming such problems. The role of semiconducting properties in determining the pitting behaviour of passive films on W in solutions containing halide is presented and discussed. The validity of a recently proposed correlation between the solid state properties of passive films and the pitting potential is critically reviewed.",
keywords = "semiconductors; pitting; Mott-Schottky theory",
author = "{Di Quarto}, Francesco and Monica Santamaria and Santamaria and {Di Quarto}",
year = "2004",
language = "English",
volume = "39",
pages = "71--81",
journal = "Corrosion Engineering Science and Technology",
issn = "1478-422X",
publisher = "Maney Publishing",

}

TY - JOUR

T1 - Semiconductor electrochemistry approach to passivity and passivity breakdown of metals and metallic alloys

AU - Di Quarto, Francesco

AU - Santamaria, Monica

AU - Santamaria, null

AU - Di Quarto, null

PY - 2004

Y1 - 2004

N2 - A critical appraisal of the use of the theory of semiconductors in characterising passive films on metals and alloys is provided, with special emphasis on the use of Mott – Schottky theory for the location of characteristic energy levels of the passive film – electrolyte junction. Some inconsistencies between theory and experimental results in the case of thin passive films are discussed together with possible alternative ways for overcoming such problems. The role of semiconducting properties in determining the pitting behaviour of passive films on W in solutions containing halide is presented and discussed. The validity of a recently proposed correlation between the solid state properties of passive films and the pitting potential is critically reviewed.

AB - A critical appraisal of the use of the theory of semiconductors in characterising passive films on metals and alloys is provided, with special emphasis on the use of Mott – Schottky theory for the location of characteristic energy levels of the passive film – electrolyte junction. Some inconsistencies between theory and experimental results in the case of thin passive films are discussed together with possible alternative ways for overcoming such problems. The role of semiconducting properties in determining the pitting behaviour of passive films on W in solutions containing halide is presented and discussed. The validity of a recently proposed correlation between the solid state properties of passive films and the pitting potential is critically reviewed.

KW - semiconductors; pitting; Mott-Schottky theory

UR - http://hdl.handle.net/10447/15129

M3 - Article

VL - 39

SP - 71

EP - 81

JO - Corrosion Engineering Science and Technology

JF - Corrosion Engineering Science and Technology

SN - 1478-422X

ER -