In this work, we investigated on microwave parameters geometry dependence in Graphene Field Effect Transistors (GFETs). A DC and RF characterization of the fabricated GFETs has been performed. The parametric analysis was carried out on 24 GFET families fabricated on the same chip and differing only for the channel length (Δ) and the gate length (Lg). In order to obtain a statistical average, each family included ten devices with the same geometry.Our study demonstrates that the output resistance and the cut-off frequency depend on both Δ and Lg. As expected, Rout increases with the graphene channel surface thus confirming the good quality of the fabrication procedures. An optimum region which maximizes the cut-off frequency has been found.
|Numero di pagine||0|
|Stato di pubblicazione||Published - 2016|