TY - CONF
T1 - Preliminary radiation hardness tests of single photon Si detectors
AU - Principato, Fabio
AU - Piana, Angelo
AU - Condorelli, null
AU - Carbone, null
AU - Fallica, Pier Giorgio
AU - Pagano, null
AU - Lombardo, null
AU - Fallica, null
AU - Libertino, null
AU - Sanfilippo, Delfo
AU - Falci, null
AU - Mazzillo, Massimo
AU - Valvo, null
AU - Cannella, Giuseppe
PY - 2010
Y1 - 2010
N2 - Single photon Si detectors were fabricated by STMicroelectronics and fully characterized in standard operation conditions and after irradiations. Both single cells and arrays, of dimensions ranging from 5x5 up to 64x64, were electrically tested. The devices operation was studied as a function of the temperature from -25°C to 65°C varying the voltage over breakdown, from 5% up to 20% of the breakdown voltage before and after irradiation using both light ions, 10 MeV B ions to doses in the range 3
AB - Single photon Si detectors were fabricated by STMicroelectronics and fully characterized in standard operation conditions and after irradiations. Both single cells and arrays, of dimensions ranging from 5x5 up to 64x64, were electrically tested. The devices operation was studied as a function of the temperature from -25°C to 65°C varying the voltage over breakdown, from 5% up to 20% of the breakdown voltage before and after irradiation using both light ions, 10 MeV B ions to doses in the range 3
KW - Silicon Photomultiplier
KW - X-rays
irradiation
KW - dark count
KW - gain
KW - light ion irradiation
KW - single photon avalanche diode
KW - Silicon Photomultiplier
KW - X-rays
irradiation
KW - dark count
KW - gain
KW - light ion irradiation
KW - single photon avalanche diode
UR - http://hdl.handle.net/10447/49008
M3 - Other
ER -