Preliminary radiation hardness tests of single photon Si detectors

Fabio Principato, Angelo Piana, Condorelli, Carbone, Pier Giorgio Fallica, Pagano, Lombardo, Fallica, Libertino, Delfo Sanfilippo, Falci, Massimo Mazzillo, Valvo, Giuseppe Cannella

Risultato della ricerca: Other

2 Citazioni (Scopus)

Abstract

Single photon Si detectors were fabricated by STMicroelectronics and fully characterized in standard operation conditions and after irradiations. Both single cells and arrays, of dimensions ranging from 5x5 up to 64x64, were electrically tested. The devices operation was studied as a function of the temperature from -25°C to 65°C varying the voltage over breakdown, from 5% up to 20% of the breakdown voltage before and after irradiation using both light ions, 10 MeV B ions to doses in the range 3
Lingua originaleEnglish
Numero di pagine8
Stato di pubblicazionePublished - 2010

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Fingerprint Entra nei temi di ricerca di 'Preliminary radiation hardness tests of single photon Si detectors'. Insieme formano una fingerprint unica.

  • Cita questo

    Principato, F., Piana, A., Condorelli, Carbone, Fallica, P. G., Pagano, Lombardo, Fallica, Libertino, Sanfilippo, D., Falci, Mazzillo, M., Valvo, & Cannella, G. (2010). Preliminary radiation hardness tests of single photon Si detectors.