Physico-Chemical Characterization of Ta2O5 Thin Films/Electrolyte Junctions

Risultato della ricerca: Otherpeer review

Abstract

An analysis of the electronic properties of Ta2O5 / electrolyte junction is reported for thin film (≤ 14 nm) grownon tantalum in acidic electrolyte. The investigation is carried out by the synergetic use of three techniques:Photocurrent Spectroscopy (PCS), Electrochemical Impedance Spectroscopy (EIS) and Differential Admittance(DA) measurements. PCS is a non destructive optical technique based on the analysis of the electrochemicalresponse (photocurrent or photopotential) of the electrode/electrolyte interface under irradiation with photons ofsuitable energy. PCS can provide information on the energetic of metal/oxide/electrolyte interfaces (flat bandpotential determination, conduction and valence band edges location). EIS allows to model the electrochemicalbehaviour of the oxide/electrolyte interface and DA measurements allow to get information on the tantalumgrown in the investigated conditions.
Lingua originaleEnglish
Pagine1-4
Numero di pagine4
Stato di pubblicazionePublished - 2007

All Science Journal Classification (ASJC) codes

  • Computer Networks and Communications
  • Electrical and Electronic Engineering

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