Photoelectrochemical evidence of Nitrogen Incorporation during Anodizing of valve metals alloys

Francesco Di Franco; Francesco Di Quarto; Andrea Zaffora; Monica Santamaria

Photoelectrochemical evidence of Nitrogen Incorporation during Anodizing of valve metals alloys

Francesco Di Franco, Francesco Di Quarto, Andrea Zaffora, Monica Santamaria

Ingegneria

Risultato della ricerca: Conference contribution

Abstract

Amorphous and/or nanocrystalline oxide films can be easily prepared electrochemically by anodizing. The anodizing allows to grow oxides with structural and compositional features easily and strictly controlled by the process parameters.

Lingua originale	English
Titolo della pubblicazione ospite	Giornate Elettrochimica Italiana GEI2015
Numero di pagine	1
Stato di pubblicazione	Published - 2015

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title = "Photoelectrochemical evidence of Nitrogen Incorporation during Anodizing of valve metals alloys",

abstract = "Amorphous and/or nanocrystalline oxide films can be easily prepared electrochemically by anodizing. The anodizing allows to grow oxides with structural and compositional features easily and strictly controlled by the process parameters.",

author = "{Di Franco}, Francesco and {Di Quarto}, Francesco and Andrea Zaffora and Monica Santamaria",

year = "2015",

language = "English",

booktitle = "Giornate Elettrochimica Italiana GEI2015",

}

TY - GEN

T1 - Photoelectrochemical evidence of Nitrogen Incorporation during Anodizing of valve metals alloys

AU - Di Franco, Francesco

AU - Di Quarto, Francesco

AU - Zaffora, Andrea

AU - Santamaria, Monica

PY - 2015

Y1 - 2015

N2 - Amorphous and/or nanocrystalline oxide films can be easily prepared electrochemically by anodizing. The anodizing allows to grow oxides with structural and compositional features easily and strictly controlled by the process parameters.

AB - Amorphous and/or nanocrystalline oxide films can be easily prepared electrochemically by anodizing. The anodizing allows to grow oxides with structural and compositional features easily and strictly controlled by the process parameters.

UR - http://hdl.handle.net/10447/189699

M3 - Conference contribution

BT - Giornate Elettrochimica Italiana GEI2015

ER -