Photoelectrochemical and XPS characterisation of oxide layers on 316L stainless steel grown in high-temperature water

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28 Citazioni (Scopus)

Abstract

Passive films on AISI 316L stainless steel were grown by exposure in high temperature (300 °C and 150 bar) water. X-ray photoelectron spectroscopy was employed to study their composition as a function of immersion time. A photoelectrochemical investigation, supported by electrochemical and impedance measurements, allowed to get information on the solid-state properties of the investigated layers. The experimental results suggest the formation of a stratified layer with an outer iron-rich layer and an inner Cr-rich oxide layer, whose relative thickness and composition are dependent on the immersion time.
Lingua originaleEnglish
pagine (da-a)3511-3519
Numero di pagine9
RivistaJournal of Solid State Electrochemistry
Volume19
Stato di pubblicazionePublished - 2015

All Science Journal Classification (ASJC) codes

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  • ???subjectarea.asjc.3100.3104???
  • ???subjectarea.asjc.1600.1603???
  • ???subjectarea.asjc.2200.2208???

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