Nanocrystal MOS with silicon-rich oxide

Isodiana Crupi; null Lombardo; null Vulpio; null Melanotte; Isodiana Crupi; null Fazio; null Rimini; null Gerardi

Nanocrystal MOS with silicon-rich oxide

Isodiana Crupi, Lombardo, Vulpio, Melanotte, Isodiana Crupi, Fazio, Rimini, Gerardi

Ingegneria

Risultato della ricerca: Other › peer review

Abstract

By electrical measurements we investigate the charge trapping and the charge transport in MOS capacitors in which the gate oxide has been replaced with a silicon rich oxide (SRO) film sandwiched between two thin SiO2 layers.

Lingua originale	English
Pagine	675-680
Numero di pagine	6
Stato di pubblicazione	Published - 2002

All Science Journal Classification (ASJC) codes

???subjectarea.asjc.3100.3107???
???subjectarea.asjc.2500.2500???
???subjectarea.asjc.3100.3104???

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@conference{cf713a3efb794588bd6b6b05cd7c5364,

title = "Nanocrystal MOS with silicon-rich oxide",

abstract = "By electrical measurements we investigate the charge trapping and the charge transport in MOS capacitors in which the gate oxide has been replaced with a silicon rich oxide (SRO) film sandwiched between two thin SiO2 layers.",

author = "Isodiana Crupi and Lombardo and Vulpio and Melanotte and Isodiana Crupi and Fazio and Rimini and Gerardi",

year = "2002",

language = "English",

pages = "675--680",

}

TY - CONF

T1 - Nanocrystal MOS with silicon-rich oxide

AU - Crupi, Isodiana

AU - Lombardo, null

AU - Vulpio, null

AU - Melanotte, null

AU - Crupi, Isodiana

AU - Fazio, null

AU - Rimini, null

AU - Gerardi, null

PY - 2002

Y1 - 2002

N2 - By electrical measurements we investigate the charge trapping and the charge transport in MOS capacitors in which the gate oxide has been replaced with a silicon rich oxide (SRO) film sandwiched between two thin SiO2 layers.

AB - By electrical measurements we investigate the charge trapping and the charge transport in MOS capacitors in which the gate oxide has been replaced with a silicon rich oxide (SRO) film sandwiched between two thin SiO2 layers.

UR - http://hdl.handle.net/10447/179620

UR - http://www.ttp.net

M3 - Other

SP - 675

EP - 680

ER -

Nanocrystal MOS with silicon-rich oxide

Abstract

All Science Journal Classification (ASJC) codes

Altri file e collegamenti

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