Abstract
We report a study by electron paramagnetic resonance on the E0 point defect in amorphous silicondioxide (a-SiO2). Our experiments were performed on -ray irradiated oxygen-deficient materials andpointed out that the 29Si hyperfine structure of the E0 consists of a pair of lines split by 49 mT. On thebasis of the experimental results, a microscopic model is proposed for the E0 center, consisting of a holetrapped in an oxygen vacancy with the unpaired electron sp3 orbital pointing away from the vacancy in aback-projected configuration and interacting with an extra oxygen atom of the a-SiO2 matrix.
Lingua originale | English |
---|---|
pagine (da-a) | 1801-1804 |
Numero di pagine | 4 |
Rivista | Journal of Non-Crystalline Solids |
Volume | 351 |
Stato di pubblicazione | Published - 2005 |
All Science Journal Classification (ASJC) codes
- ???subjectarea.asjc.2500.2504???
- ???subjectarea.asjc.2500.2503???
- ???subjectarea.asjc.3100.3104???
- ???subjectarea.asjc.2500.2505???