Abstract
Barium Strontium Titanate (Ba0.5Sr0.5TiO3 or BST) films were grown by means of a reactive pulsed laser deposition technique on SiO2/Si substrates. Microstructural and surface morphology of BST films were characterized by X-ray diffraction (XRD) scanning electron microscopy (SEM) and atomic force microscopy (AFM).
Lingua originale | English |
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Pagine | I10.3-I10.3 |
Stato di pubblicazione | Published - 2006 |