Microstrutural, Optical and electro-optical Properties Of Ba0.5Sr0.5TiO3 Thin Film Deposited By Pulsed Laser Deposition For Active Low Loss Waveguide Applications

Pasquale Cusumano

Microstrutural, Optical and electro-optical Properties Of Ba0.5Sr0.5TiO3 Thin Film Deposited By Pulsed Laser Deposition For Active Low Loss Waveguide Applications

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Risultato della ricerca: Other

Abstract

Barium Strontium Titanate (Ba0.5Sr0.5TiO3 or BST) films were grown by means of a reactive pulsed laser deposition technique on SiO2/Si substrates. Microstructural and surface morphology of BST films were characterized by X-ray diffraction (XRD) scanning electron microscopy (SEM) and atomic force microscopy (AFM).

Lingua originale	English
Pagine	I10.3-I10.3
Stato di pubblicazione	Published - 2006

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title = "Microstrutural, Optical and electro-optical Properties Of Ba0.5Sr0.5TiO3 Thin Film Deposited By Pulsed Laser Deposition For Active Low Loss Waveguide Applications",

abstract = "Barium Strontium Titanate (Ba0.5Sr0.5TiO3 or BST) films were grown by means of a reactive pulsed laser deposition technique on SiO2/Si substrates. Microstructural and surface morphology of BST films were characterized by X-ray diffraction (XRD) scanning electron microscopy (SEM) and atomic force microscopy (AFM).",

author = "Pasquale Cusumano",

year = "2006",

language = "English",

pages = "I10.3--I10.3",

}

TY - CONF

T1 - Microstrutural, Optical and electro-optical Properties Of Ba0.5Sr0.5TiO3 Thin Film Deposited By Pulsed Laser Deposition For Active Low Loss Waveguide Applications

AU - Cusumano, Pasquale

PY - 2006

Y1 - 2006

N2 - Barium Strontium Titanate (Ba0.5Sr0.5TiO3 or BST) films were grown by means of a reactive pulsed laser deposition technique on SiO2/Si substrates. Microstructural and surface morphology of BST films were characterized by X-ray diffraction (XRD) scanning electron microscopy (SEM) and atomic force microscopy (AFM).

AB - Barium Strontium Titanate (Ba0.5Sr0.5TiO3 or BST) films were grown by means of a reactive pulsed laser deposition technique on SiO2/Si substrates. Microstructural and surface morphology of BST films were characterized by X-ray diffraction (XRD) scanning electron microscopy (SEM) and atomic force microscopy (AFM).

UR - http://hdl.handle.net/10447/1658

M3 - Other

SP - I10.3-I10.3

ER -