TY - GEN
T1 - Improving SIFT-based descriptors stability to rotations
AU - Bellavia, Fabio
AU - Tegolo, Domenico
AU - Trucco, Emanuele
PY - 2010
Y1 - 2010
N2 - Image descriptors are widely adopted structures to match image features. SIFT-based descriptors are collections of gradient orientation histograms computed on different feature regions, commonly divided by using a regular Cartesian grid or a log-polar grid. In order to achieve rotation invariance, feature patches have to be generally rotated in the direction of the dominant gradient orientation. In this paper we present a modification of the GLOH descriptor, a SIFT-based descriptor based on a log-polar grid, which avoids to rotate the feature patch before computing the descriptor since predefined discrete orientations can be easily derived by shifting the descriptor vector. The proposed descriptors, called sGLOH and sGLOH+, have been compared with the SIFT descriptor on the Oxford image dataset, with good results which point out its robustness and stability
AB - Image descriptors are widely adopted structures to match image features. SIFT-based descriptors are collections of gradient orientation histograms computed on different feature regions, commonly divided by using a regular Cartesian grid or a log-polar grid. In order to achieve rotation invariance, feature patches have to be generally rotated in the direction of the dominant gradient orientation. In this paper we present a modification of the GLOH descriptor, a SIFT-based descriptor based on a log-polar grid, which avoids to rotate the feature patch before computing the descriptor since predefined discrete orientations can be easily derived by shifting the descriptor vector. The proposed descriptors, called sGLOH and sGLOH+, have been compared with the SIFT descriptor on the Oxford image dataset, with good results which point out its robustness and stability
UR - http://hdl.handle.net/10447/226245
M3 - Conference contribution
SN - 978-1-4244-7541-4
T3 - INTERNATIONAL CONFERENCE ON PATTERN RECOGNITION
SP - 3460
EP - 3463
BT - Pattern Recognition, International Conference on
ER -