In this paper nanocrystals memories program curves are shown and their saturation points (steady state condition) can be observed. We present a model that relates the voltage shift at the steady state (ΔVTss) to the gate program voltage (VG). Starting from a good agreement between experimental data and simulations for nanocrystals memory cells with a conventional dielectric structure (SiO2), we present the estimated values of the ΔVTss vs VG for different control stacks. Our investigation shows an improvement if a material with a high dielectric constant and a small conduction band-offset with respect to the SiO2, is placed between two SiO2 layers when the first of them is very thin. © 2004 Elsevier Ltd. All rights reserved.
|Numero di pagine||4|
|Stato di pubblicazione||Published - 2005|
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Condensed Matter Physics
- Safety, Risk, Reliability and Quality
- Surfaces, Coatings and Films
- Electrical and Electronic Engineering
Crupi, I., Spitale, Lombardo, Corso, Crupi, I., & Gerardi (2005). Improvement of the P/E window in nanocrystal memories by the use of high-k materials in the control dielectric. MICROELECTRONICS RELIABILITY, 45, 895-898.