Implementation of a fast and low cost IR-NDT technique by means of a Square PulseModulated Lock-In Thermography

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This work describes the development of an IR-NDT procedure based on a lock-in signal treatment in the frequency domain to obtain phase-contrast defect signatures. Heat stimulation is obtained by periodically shattering a common low-power halogen lamp. The delivered heat is then modulated as a train of square waves with multi-frequency harmonic content. The proposed lock-in algorithm is able to selectively retrieve phase and amplitude information at various frequencies of the acquired temperature, acting also as a narrow band filter to improve defect-signature to noise ratio. The procedure is implemented and evaluated by means of low cost IR equipment to investigate artificially defected thick Glass Reinforced Plastic (GRP) panels.
Lingua originaleEnglish
Numero di pagine0
Stato di pubblicazionePublished - 2012


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