High resolution x-ray investigation of periodically poled lithium tantalate crystals with short periodicity

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6 Citazioni (Scopus)

Abstract

Domain engineering technology in lithium tantalate is a well studied approach for nonlinear optical applications. However, for several cases of interest, the realization of short period structures (<2 μm) is required, which make their characterization difficult with standard techniques. In this work, we show that high resolution x-ray diffraction is a convenient approach for the characterization of such structures, allowing us to obtain in a nondestructive fashion information such as the average domain period, the domain wall inclination, and the overall structure quality.
Lingua originaleEnglish
Numero di pagine4
RivistaJournal of Applied Physics
Volume106
Stato di pubblicazionePublished - 2009

All Science Journal Classification (ASJC) codes

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