Evidence of delocalized excitons in amorphous solids

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23 Citazioni (Scopus)

Abstract

We studied the temperature dependence of the absorption coefficient of amorphous SiO2 in the range from 8 to 17.5 eVobtained by Kramers-Kronig dispersion analysis of reflectivity spectra. We demonstrate the main excitonic resonance at 10.4 eV to feature a close Lorentzian shape redshifting with increasingtemperature. This provides a strong evidence of excitons being delocalized notwithstanding the structural disorder intrinsic to amorphous SiO2. Excitons turn out to be coupled to an average phonon mode of 83 meV energy.
Lingua originaleEnglish
pagine (da-a)116401-1-116401-4
Numero di pagine4
RivistaPhysical Review Letters
Volume105
Stato di pubblicazionePublished - 2010

All Science Journal Classification (ASJC) codes

  • ???subjectarea.asjc.3100.3100???

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