EPR on Radiation-Induced Defects in SiO2

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Abstract

Continuous-wave electron paramagnetic resonance (EPR) spectroscopy has been the technique of choice for the studies of radiation-induced defects in silica (SiO2) for 60 years, and has recently been expanded to include more sophisticated techniques such as high-frequency EPR, pulse electron nuclear double resonance (ENDOR), and pulse electron spin echo envelope modulation (ESEEM) spectroscopy. Structural models of radiation-induced defects obtained from single-crystal EPR analyses of crystalline SiO2 (alfa-quartz) are often applicable to their respective analogues in amorphous silica (a-SiO2), although significant differences are common.
Lingua originaleEnglish
Titolo della pubblicazione ospiteApplications of EPR in Radiation Research
Pagine255-295
Numero di pagine41
Stato di pubblicazionePublished - 2014

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Alessi, A., Buscarino, G., & Agnello, S. (2014). EPR on Radiation-Induced Defects in SiO2. In Applications of EPR in Radiation Research (pagg. 255-295)