New generation spectroscopy systems have advanced towards digital pulse processing(DPP) approaches. DPP systems, based on direct digitizing and processing of detector signals,have recently been favoured over analog pulse processing electronics, ensuring higher flexibility,stability, lower dead time, higher throughput and better spectroscopic performance. In this work,we present the performance of a new real time DPP system for X-ray and gamma ray semiconductordetectors. The system is based on a commercial digitizer equipped with a custom DPP firmware,developed by our group, for on-line pulse shape and height analysis. X-ray and gamma ray spectrameasurements with cadmium telluride (CdTe) and germanium (Ge) detectors, coupled to resistivefeedbackpreamplifiers, highlight the excellent performance of the system both at low and high rateenvironments (up to 800 kcps). A comparison with a conventional analog electronics showed thebetter high-rate capabilities of the digital approach, in terms of energy resolution and throughput.These results make the proposed DPP system a very attractive tool for both laboratory research andfor the development of advanced detection systems for high-rate-resolution spectroscopic imaging,recently proposed in diagnostic medicine, industrial imaging and security screening.
|Numero di pagine||17|
|Rivista||Journal of Instrumentation|
|Stato di pubblicazione||Published - 2013|
All Science Journal Classification (ASJC) codes
- Mathematical Physics