Electron paramagnetic resonance investigation on the hyperfine structure of the E'δ center in amorphous silicon dioxide

Risultato della ricerca: Articlepeer review

1 Citazioni (Scopus)

Abstract

We report an experimental investigation by electron paramagnetic resonance (EPR) spectroscopy on the hyperfine structure of the center in γ-ray irradiated amorphous silicon dioxide materials. This study has driven us to the determination of the intensity ratio between the hyperfine doublet and the main resonance line of this point defect. This ratio was obtained for a variety of silica samples and compared with the analogous ratio obtained for the defect. The comparison definitively confirms that the electronic wave function involved in the center is actually delocalized over four nearly equivalent Si atoms
Lingua originaleEnglish
pagine (da-a)518-521
Numero di pagine4
RivistaJournal of Non-Crystalline Solids
Volume353
Stato di pubblicazionePublished - 2007

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Ceramics and Composites
  • Condensed Matter Physics
  • Materials Chemistry

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