Electrical Characterization of CdTe pixel detectors with Al Schottky anode

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19 Citazioni (Scopus)

Abstract

Pixelated Schottky Al/p-CdTe/Pt detectors are very attractive devices for high-resolution Xrayspectroscopic imaging, even though they suffer from bias-induced time instability (polarization). Inthis work, we present the results of the electrical characterization of a (4x4) pixelated Schottky Al/p-CdTe/Pt detector. Current-voltage (I-V) characteristics and current transients were investigated atdifferent temperatures. The results show as deep levels play a dominant role in the charge transportmechanism. The conduction mechanism is dominated by the space charge limited current (SCLC) bothunder forward bias and at high reverse bias. Schottky barrier height of the Al/CdTe contact wasestimated by using the thermionic-field emission model at low reverse bias voltages. Activation energyof the deep levels was measured through the analysis of the reverse current transients at differenttemperatures. Finally, we employed an analytical method to determine the density and the energydistribution of the traps from SCLC current-voltage characteristics.
Lingua originaleEnglish
pagine (da-a)476-482
Numero di pagine7
RivistaNUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION A, ACCELERATORS, SPECTROMETERS, DETECTORS AND ASSOCIATED EQUIPMENT
Volume763
Stato di pubblicazionePublished - 2014

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Electric space charge
Anodes
anodes
Pixels
pixels
Detectors
Thermionic emission
detectors
Current voltage characteristics
Bias voltage
Field emission
Chemical activation
Polarization
Imaging techniques
space charge
Electric potential
electric potential
thermionic emission
Temperature
field emission

All Science Journal Classification (ASJC) codes

  • Nuclear and High Energy Physics
  • Instrumentation

Cita questo

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title = "Electrical Characterization of CdTe pixel detectors with Al Schottky anode",
abstract = "Pixelated Schottky Al/p-CdTe/Pt detectors are very attractive devices for high-resolution Xrayspectroscopic imaging, even though they suffer from bias-induced time instability (polarization). Inthis work, we present the results of the electrical characterization of a (4x4) pixelated Schottky Al/p-CdTe/Pt detector. Current-voltage (I-V) characteristics and current transients were investigated atdifferent temperatures. The results show as deep levels play a dominant role in the charge transportmechanism. The conduction mechanism is dominated by the space charge limited current (SCLC) bothunder forward bias and at high reverse bias. Schottky barrier height of the Al/CdTe contact wasestimated by using the thermionic-field emission model at low reverse bias voltages. Activation energyof the deep levels was measured through the analysis of the reverse current transients at differenttemperatures. Finally, we employed an analytical method to determine the density and the energydistribution of the traps from SCLC current-voltage characteristics.",
author = "Turturici, {Accursio Antonio} and Gaetano Gerardi and Leonardo Abbene and Fabio Principato",
year = "2014",
language = "English",
volume = "763",
pages = "476--482",
journal = "NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION A, ACCELERATORS, SPECTROMETERS, DETECTORS AND ASSOCIATED EQUIPMENT",
issn = "0168-9002",

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TY - JOUR

T1 - Electrical Characterization of CdTe pixel detectors with Al Schottky anode

AU - Turturici, Accursio Antonio

AU - Gerardi, Gaetano

AU - Abbene, Leonardo

AU - Principato, Fabio

PY - 2014

Y1 - 2014

N2 - Pixelated Schottky Al/p-CdTe/Pt detectors are very attractive devices for high-resolution Xrayspectroscopic imaging, even though they suffer from bias-induced time instability (polarization). Inthis work, we present the results of the electrical characterization of a (4x4) pixelated Schottky Al/p-CdTe/Pt detector. Current-voltage (I-V) characteristics and current transients were investigated atdifferent temperatures. The results show as deep levels play a dominant role in the charge transportmechanism. The conduction mechanism is dominated by the space charge limited current (SCLC) bothunder forward bias and at high reverse bias. Schottky barrier height of the Al/CdTe contact wasestimated by using the thermionic-field emission model at low reverse bias voltages. Activation energyof the deep levels was measured through the analysis of the reverse current transients at differenttemperatures. Finally, we employed an analytical method to determine the density and the energydistribution of the traps from SCLC current-voltage characteristics.

AB - Pixelated Schottky Al/p-CdTe/Pt detectors are very attractive devices for high-resolution Xrayspectroscopic imaging, even though they suffer from bias-induced time instability (polarization). Inthis work, we present the results of the electrical characterization of a (4x4) pixelated Schottky Al/p-CdTe/Pt detector. Current-voltage (I-V) characteristics and current transients were investigated atdifferent temperatures. The results show as deep levels play a dominant role in the charge transportmechanism. The conduction mechanism is dominated by the space charge limited current (SCLC) bothunder forward bias and at high reverse bias. Schottky barrier height of the Al/CdTe contact wasestimated by using the thermionic-field emission model at low reverse bias voltages. Activation energyof the deep levels was measured through the analysis of the reverse current transients at differenttemperatures. Finally, we employed an analytical method to determine the density and the energydistribution of the traps from SCLC current-voltage characteristics.

UR - http://hdl.handle.net/10447/95366

M3 - Article

VL - 763

SP - 476

EP - 482

JO - NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION A, ACCELERATORS, SPECTROMETERS, DETECTORS AND ASSOCIATED EQUIPMENT

JF - NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION A, ACCELERATORS, SPECTROMETERS, DETECTORS AND ASSOCIATED EQUIPMENT

SN - 0168-9002

ER -