Delocalized nature of the E’_delta center in amorphous silicon dioxide

Risultato della ricerca: Articlepeer review

19 Citazioni (Scopus)


We report an experimental study by electron paramagnetic resonance (EPR) of E'_delta point defect induced by gamma-ray irradiation in amorphous SiO2. We obtained an estimation of the intensity of the 10 mT doublet characterizing the EPR spectrum of such a defect arising from hyperfine interaction of the unpaired electron with a 29Si (I = 1/2) nucleus. Moreover, determining the intensity ratio between this hyperfine doublet and the main resonance line of E'_delta center, we pointed out that the unpaired electron wave function of this center is actually delocalized over four nearly equivalent silicon atoms.
Lingua originaleEnglish
pagine (da-a)125501 1-125501 4
RivistaPhysical Review Letters
Stato di pubblicazionePublished - 2005

All Science Journal Classification (ASJC) codes

  • ???subjectarea.asjc.3100???


Entra nei temi di ricerca di 'Delocalized nature of the E’_delta center in amorphous silicon dioxide'. Insieme formano una fingerprint unica.

Cita questo