Dangerous Effects Induced on Power MOSFETs by Terrestrial Neutrons

Aldo Parlato, Elio Angelo Tomarchio, Consentino, Calogero Pace, Laudani, Mazzeo, Privitera, J.L. Hernandez Ambato, Giordano

Risultato della ricerca: Otherpeer review

Abstract

This paper investigates the effects that terrestrial neutrons can induce on power MOSFETs when they are biasedduring their normal working conditions especially in inverters for photovoltaic applications. After a brief review of power MOSFETs failure phenomena caused by neutron irradiation (with emphasis on so called “Single Event Effects” (SEE)), the results of an accelerated test performed with the Am-Be source atthe University of Palermo are discussed.
Lingua originaleEnglish
Numero di pagine6
Stato di pubblicazionePublished - 2013

All Science Journal Classification (ASJC) codes

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