This paper investigates the effects that terrestrial neutrons can induce on power MOSFETs when they are biasedduring their normal working conditions especially in inverters for photovoltaic applications. After a brief review of power MOSFETs failure phenomena caused by neutron irradiation (with emphasis on so called “Single Event Effects” (SEE)), the results of an accelerated test performed with the Am-Be source atthe University of Palermo are discussed.
|Numero di pagine||6|
|Stato di pubblicazione||Published - 2013|
All Science Journal Classification (ASJC) codes
- Computer Science (miscellaneous)