Dangerous Effects Induced on Power MOSFETs by Terrestrial Neutrons

Aldo Parlato, Elio Angelo Tomarchio, Consentino, Calogero Pace, Laudani, Mazzeo, Privitera, J.L. Hernandez Ambato, Giordano

Risultato della ricerca: Other


This paper investigates the effects that terrestrial neutrons can induce on power MOSFETs when they are biasedduring their normal working conditions especially in inverters for photovoltaic applications. After a brief review of power MOSFETs failure phenomena caused by neutron irradiation (with emphasis on so called “Single Event Effects” (SEE)), the results of an accelerated test performed with the Am-Be source atthe University of Palermo are discussed.
Lingua originaleEnglish
Numero di pagine6
Stato di pubblicazionePublished - 2013


All Science Journal Classification (ASJC) codes

  • Computer Science (miscellaneous)

Cita questo

Parlato, A., Tomarchio, E. A., Consentino, Pace, C., Laudani, Mazzeo, Privitera, Ambato, J. L. H., & Giordano (2013). Dangerous Effects Induced on Power MOSFETs by Terrestrial Neutrons.