Characterization of MEMS accelerometer self-noise by means of PSD and Allan Variance analysis

Luca Greco; Adriano Fagiolini; Roberto D'Anna; Salvatore Scudero; Antonio Costanza; Antonino D'Alessandro; Giovanni Vitale; Antonino D'Alessandro; Antonino D'Alessandro; Antonino D'Alessandro; Antonino D'Alessandro

Characterization of MEMS accelerometer self-noise by means of PSD and Allan Variance analysis

Luca Greco, Adriano Fagiolini, Roberto D'Anna, Salvatore Scudero, Antonio Costanza, Antonino D'Alessandro, Giovanni Vitale, Antonino D'Alessandro, Antonino D'Alessandro, Antonino D'Alessandro, Antonino D'Alessandro

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Risultato della ricerca: Conference contribution

18 Citazioni (Scopus)

Abstract

In this paper, we have studied the sources of error of a low-cost 3-axis MEMS accelerometer by means of Power Spectral Density and Allan Variance techniques. These techniques were applied to the signals acquired from ten identical devices to characterize the variability of the sensor produced by the same manufacturer. Our analysis showed as identically produced accelerometer have somehow variable behavior in particular at low frequency. It is therefore of paramount importance before their use in Inertial Navigation or Earthquakes Monitoring System, a complete characterization of each single sensors.

Lingua originale	English
Titolo della pubblicazione ospite	Proceedings of the 7th IEEE International Workshop on Advances in Sensors and Interfaces (IWASI)
Numero di pagine	7
Stato di pubblicazione	Published - 2017

All Science Journal Classification (ASJC) codes

Electrical and Electronic Engineering
Instrumentation

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Greco, L., Fagiolini, A., D'Anna, R., Scudero, S., Costanza, A., D'Alessandro, A., Vitale, G., D'Alessandro, A., D'Alessandro, A., D'Alessandro, A., & D'Alessandro, A. (2017). Characterization of MEMS accelerometer self-noise by means of PSD and Allan Variance analysis. In Proceedings of the 7th IEEE International Workshop on Advances in Sensors and Interfaces (IWASI)

Characterization of MEMS accelerometer self-noise by means of PSD and Allan Variance analysis. / Greco, Luca ; Fagiolini, Adriano; D'Anna, Roberto; Scudero, Salvatore; Costanza, Antonio; D'Alessandro, Antonino; Vitale, Giovanni; D'Alessandro, Antonino; D'Alessandro, Antonino; D'Alessandro, Antonino; D'Alessandro, Antonino.

Proceedings of the 7th IEEE International Workshop on Advances in Sensors and Interfaces (IWASI). 2017.

Risultato della ricerca: Conference contribution

Greco, Luca ; Fagiolini, Adriano ; D'Anna, Roberto ; Scudero, Salvatore ; Costanza, Antonio ; D'Alessandro, Antonino ; Vitale, Giovanni ; D'Alessandro, Antonino ; D'Alessandro, Antonino ; D'Alessandro, Antonino ; D'Alessandro, Antonino. / Characterization of MEMS accelerometer self-noise by means of PSD and Allan Variance analysis. Proceedings of the 7th IEEE International Workshop on Advances in Sensors and Interfaces (IWASI). 2017.

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abstract = "In this paper, we have studied the sources of error of a low-cost 3-axis MEMS accelerometer by means of Power Spectral Density and Allan Variance techniques. These techniques were applied to the signals acquired from ten identical devices to characterize the variability of the sensor produced by the same manufacturer. Our analysis showed as identically produced accelerometer have somehow variable behavior in particular at low frequency. It is therefore of paramount importance before their use in Inertial Navigation or Earthquakes Monitoring System, a complete characterization of each single sensors.",

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AU - Greco, Luca

AU - Fagiolini, Adriano

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AU - Costanza, Antonio

AU - D'Alessandro, Antonino

AU - Vitale, Giovanni

AU - D'Alessandro, Antonino

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N2 - In this paper, we have studied the sources of error of a low-cost 3-axis MEMS accelerometer by means of Power Spectral Density and Allan Variance techniques. These techniques were applied to the signals acquired from ten identical devices to characterize the variability of the sensor produced by the same manufacturer. Our analysis showed as identically produced accelerometer have somehow variable behavior in particular at low frequency. It is therefore of paramount importance before their use in Inertial Navigation or Earthquakes Monitoring System, a complete characterization of each single sensors.

AB - In this paper, we have studied the sources of error of a low-cost 3-axis MEMS accelerometer by means of Power Spectral Density and Allan Variance techniques. These techniques were applied to the signals acquired from ten identical devices to characterize the variability of the sensor produced by the same manufacturer. Our analysis showed as identically produced accelerometer have somehow variable behavior in particular at low frequency. It is therefore of paramount importance before their use in Inertial Navigation or Earthquakes Monitoring System, a complete characterization of each single sensors.

UR - http://hdl.handle.net/10447/286530

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BT - Proceedings of the 7th IEEE International Workshop on Advances in Sensors and Interfaces (IWASI)

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