Atomic force microscopy and Raman investigation on the sintering process of amorphous SiO2 nanoparticles

Risultato della ricerca: Article

23 Citazioni (Scopus)

Abstract

We report an experimental investigation on the sintering process induced in fumed silica powders byisochronal thermal treatments at T=1270 K. Three types of fumed silica are considered, consistingof amorphous SiO2 a-SiO2 particles with mean diameters 7, 14, and 40 nm. The study isperformed by atomic force microscopy AFM , to follow the morphological changes, and by Ramanscattering, to obtain information on the concomitant structural modifications. The former methodindicates that the sintering process proceeds by aggregation of single particles into larger grains,whose sizes increase with the thermal treatment duration. Furthermore, for each fumed silica typeconsidered, the quantitative analysis of the AFM images shows that the grain growth process takesplace approximately at constant rate for thermal treatment durations up to 290 h. Nevertheless, thevalue of the grain growth rate is sensitive to the system properties. In fact, it is found to increasewith decreasing the particle mean diameter, giving a strong quantitative evidence of thesize-dependence of the sintering process. On the other hand, Raman measurements indicate that thestructure of the as-received fumed silica nanoparticles is significantly modified with respect to thatof ordinary bulk a-SiO2, in agreement with previous experimental evidences. However, it rapidlyrelaxes upon thermal treatment at T=1270 K and its characterizing features are almost completelylost after treatment for about 80 h. Finally, the comparison of AFM and Raman data shows that thenanoparticles structure are completely relaxed resembling that of bulk a-SiO2 when the grainsformed by thermal treatment reach diameters greater than about 43 nm, indicating that it representsthe characteristic size above which the effects of spatial confinement on the structure of the materialbecome almost negligible.
Lingua originaleEnglish
Numero di pagine9
RivistaDefault journal
Volume108
Stato di pubblicazionePublished - 2010

Fingerprint

sintering
atomic force microscopy
nanoparticles
silicon dioxide
quantitative analysis
grain size

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

Cita questo

@article{9edb0981468e4eb28b797d6aad809ea0,
title = "Atomic force microscopy and Raman investigation on the sintering process of amorphous SiO2 nanoparticles",
abstract = "We report an experimental investigation on the sintering process induced in fumed silica powders byisochronal thermal treatments at T=1270 K. Three types of fumed silica are considered, consistingof amorphous SiO2 a-SiO2 particles with mean diameters 7, 14, and 40 nm. The study isperformed by atomic force microscopy AFM , to follow the morphological changes, and by Ramanscattering, to obtain information on the concomitant structural modifications. The former methodindicates that the sintering process proceeds by aggregation of single particles into larger grains,whose sizes increase with the thermal treatment duration. Furthermore, for each fumed silica typeconsidered, the quantitative analysis of the AFM images shows that the grain growth process takesplace approximately at constant rate for thermal treatment durations up to 290 h. Nevertheless, thevalue of the grain growth rate is sensitive to the system properties. In fact, it is found to increasewith decreasing the particle mean diameter, giving a strong quantitative evidence of thesize-dependence of the sintering process. On the other hand, Raman measurements indicate that thestructure of the as-received fumed silica nanoparticles is significantly modified with respect to thatof ordinary bulk a-SiO2, in agreement with previous experimental evidences. However, it rapidlyrelaxes upon thermal treatment at T=1270 K and its characterizing features are almost completelylost after treatment for about 80 h. Finally, the comparison of AFM and Raman data shows that thenanoparticles structure are completely relaxed resembling that of bulk a-SiO2 when the grainsformed by thermal treatment reach diameters greater than about 43 nm, indicating that it representsthe characteristic size above which the effects of spatial confinement on the structure of the materialbecome almost negligible.",
keywords = "Raman spectroscopy, atomic force microscopy, fumed silica, nanoparticles, nanotechnology, sintering",
author = "Gianpiero Buscarino and Simonpietro Agnello and Gelardi, {Franco Mario} and Gianfranco Vaccaro",
year = "2010",
language = "English",
volume = "108",
journal = "Default journal",

}

TY - JOUR

T1 - Atomic force microscopy and Raman investigation on the sintering process of amorphous SiO2 nanoparticles

AU - Buscarino, Gianpiero

AU - Agnello, Simonpietro

AU - Gelardi, Franco Mario

AU - Vaccaro, Gianfranco

PY - 2010

Y1 - 2010

N2 - We report an experimental investigation on the sintering process induced in fumed silica powders byisochronal thermal treatments at T=1270 K. Three types of fumed silica are considered, consistingof amorphous SiO2 a-SiO2 particles with mean diameters 7, 14, and 40 nm. The study isperformed by atomic force microscopy AFM , to follow the morphological changes, and by Ramanscattering, to obtain information on the concomitant structural modifications. The former methodindicates that the sintering process proceeds by aggregation of single particles into larger grains,whose sizes increase with the thermal treatment duration. Furthermore, for each fumed silica typeconsidered, the quantitative analysis of the AFM images shows that the grain growth process takesplace approximately at constant rate for thermal treatment durations up to 290 h. Nevertheless, thevalue of the grain growth rate is sensitive to the system properties. In fact, it is found to increasewith decreasing the particle mean diameter, giving a strong quantitative evidence of thesize-dependence of the sintering process. On the other hand, Raman measurements indicate that thestructure of the as-received fumed silica nanoparticles is significantly modified with respect to thatof ordinary bulk a-SiO2, in agreement with previous experimental evidences. However, it rapidlyrelaxes upon thermal treatment at T=1270 K and its characterizing features are almost completelylost after treatment for about 80 h. Finally, the comparison of AFM and Raman data shows that thenanoparticles structure are completely relaxed resembling that of bulk a-SiO2 when the grainsformed by thermal treatment reach diameters greater than about 43 nm, indicating that it representsthe characteristic size above which the effects of spatial confinement on the structure of the materialbecome almost negligible.

AB - We report an experimental investigation on the sintering process induced in fumed silica powders byisochronal thermal treatments at T=1270 K. Three types of fumed silica are considered, consistingof amorphous SiO2 a-SiO2 particles with mean diameters 7, 14, and 40 nm. The study isperformed by atomic force microscopy AFM , to follow the morphological changes, and by Ramanscattering, to obtain information on the concomitant structural modifications. The former methodindicates that the sintering process proceeds by aggregation of single particles into larger grains,whose sizes increase with the thermal treatment duration. Furthermore, for each fumed silica typeconsidered, the quantitative analysis of the AFM images shows that the grain growth process takesplace approximately at constant rate for thermal treatment durations up to 290 h. Nevertheless, thevalue of the grain growth rate is sensitive to the system properties. In fact, it is found to increasewith decreasing the particle mean diameter, giving a strong quantitative evidence of thesize-dependence of the sintering process. On the other hand, Raman measurements indicate that thestructure of the as-received fumed silica nanoparticles is significantly modified with respect to thatof ordinary bulk a-SiO2, in agreement with previous experimental evidences. However, it rapidlyrelaxes upon thermal treatment at T=1270 K and its characterizing features are almost completelylost after treatment for about 80 h. Finally, the comparison of AFM and Raman data shows that thenanoparticles structure are completely relaxed resembling that of bulk a-SiO2 when the grainsformed by thermal treatment reach diameters greater than about 43 nm, indicating that it representsthe characteristic size above which the effects of spatial confinement on the structure of the materialbecome almost negligible.

KW - Raman spectroscopy

KW - atomic force microscopy

KW - fumed silica

KW - nanoparticles

KW - nanotechnology

KW - sintering

UR - http://hdl.handle.net/10447/51578

M3 - Article

VL - 108

JO - Default journal

JF - Default journal

ER -