Anodized Ti-Si Alloy as Gate Oxide of Electrochemically-Fabricated Organic Field-Effect Transistors

Fulvio Caruso; Roberto Macaluso; Claudio Cali'; Mauro Mosca; Monica Santamaria; Francesco Di Quarto; Francesco Di Franco

Anodized Ti-Si Alloy as Gate Oxide of Electrochemically-Fabricated Organic Field-Effect Transistors

Fulvio Caruso, Roberto Macaluso, Claudio Cali', Mauro Mosca, Monica Santamaria, Francesco Di Quarto, Francesco Di Franco

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Abstract

Organic field-effect transistors were fabricated using an electrochemical route. The dielectric oxide was grown by anodization ofa Ti:Si alloy, while 3,4-polyethylenedioxythiophene has been employed as a semiconducting polymer. OutputI-Vcharacteristicsshowed a transistor effect dependent on dielectric thickness. Fitting between I-V measurements and theoretical simulations in thetriode region confirmed the presence of a conduction path through the polymer which degrades the electrical characteristics of thedevices.

Lingua originale	English
pagine (da-a)	P7-P9
Numero di pagine	3
Rivista	ECS Solid State Letters
Volume	3
Stato di pubblicazione	Published - 2014

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All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Electrical and Electronic Engineering

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Caruso, F., Macaluso, R., Cali', C., Mosca, M., Santamaria, M., Di Quarto, F., & Di Franco, F. (2014). Anodized Ti-Si Alloy as Gate Oxide of Electrochemically-Fabricated Organic Field-Effect Transistors. ECS Solid State Letters, 3, P7-P9.

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abstract = "Organic field-effect transistors were fabricated using an electrochemical route. The dielectric oxide was grown by anodization ofa Ti:Si alloy, while 3,4-polyethylenedioxythiophene has been employed as a semiconducting polymer. OutputI-Vcharacteristicsshowed a transistor effect dependent on dielectric thickness. Fitting between I-V measurements and theoretical simulations in thetriode region confirmed the presence of a conduction path through the polymer which degrades the electrical characteristics of thedevices.",

author = "Fulvio Caruso and Roberto Macaluso and Claudio Cali' and Mauro Mosca and Monica Santamaria and {Di Quarto}, Francesco and {Di Franco}, Francesco",

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journal = "ECS Solid State Letters",

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T1 - Anodized Ti-Si Alloy as Gate Oxide of Electrochemically-Fabricated Organic Field-Effect Transistors

AU - Caruso, Fulvio

AU - Macaluso, Roberto

AU - Cali', Claudio

AU - Mosca, Mauro

AU - Santamaria, Monica

AU - Di Quarto, Francesco

AU - Di Franco, Francesco

PY - 2014

Y1 - 2014

N2 - Organic field-effect transistors were fabricated using an electrochemical route. The dielectric oxide was grown by anodization ofa Ti:Si alloy, while 3,4-polyethylenedioxythiophene has been employed as a semiconducting polymer. OutputI-Vcharacteristicsshowed a transistor effect dependent on dielectric thickness. Fitting between I-V measurements and theoretical simulations in thetriode region confirmed the presence of a conduction path through the polymer which degrades the electrical characteristics of thedevices.

AB - Organic field-effect transistors were fabricated using an electrochemical route. The dielectric oxide was grown by anodization ofa Ti:Si alloy, while 3,4-polyethylenedioxythiophene has been employed as a semiconducting polymer. OutputI-Vcharacteristicsshowed a transistor effect dependent on dielectric thickness. Fitting between I-V measurements and theoretical simulations in thetriode region confirmed the presence of a conduction path through the polymer which degrades the electrical characteristics of thedevices.

UR - http://hdl.handle.net/10447/89588

UR - http://ssl.ecsdl.org/content/3/1/P7.full.pdf+html?sid=f321bcc0-80c8-440f-80f6-4a15087d0e5c

M3 - Article

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SP - P7-P9

JO - ECS Solid State Letters

JF - ECS Solid State Letters

SN - 2162-8742

ER -

Anodized Ti-Si Alloy as Gate Oxide of Electrochemically-Fabricated Organic Field-Effect Transistors

Abstract

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All Science Journal Classification (ASJC) codes

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