Abstract
Partially resolved x-ray spectra of highly charged krypton ions (Kr) was analyzed using an electron-beam ion trap (EBIT) plasma model. A microcalorimeter detector recorded the spectra in a broad x-ray energy band. Charge state distributions of krypton ions inside the EBIT was determined. In addition, the transition energies of the spectral lines were determined with some uncertainty. Many new lines in the spectra of L-shell Kr ions were identified with some diagnostic potential applicable in plasma physics.
Lingua originale | English |
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pagine (da-a) | 1-10 |
Numero di pagine | 10 |
Rivista | PHYSICAL REVIEW E, STATISTICAL, NONLINEAR, AND SOFT MATTER PHYSICS |
Volume | 63 |
Stato di pubblicazione | Published - 2001 |
All Science Journal Classification (ASJC) codes
- ???subjectarea.asjc.2600.2610???
- ???subjectarea.asjc.3100.3100???
- ???subjectarea.asjc.3100.3109???
- ???subjectarea.asjc.2600.2613???
- ???subjectarea.asjc.3100.3104???