An improved MSD-based method for PD defects classification

Pietro Romano, Testa, Abate, Romano, Romano, Buccheri, Roberto Candela

Risultato della ricerca: Otherpeer review

1 Citazioni (Scopus)


The new proposed method of pattern recognition is based on the application of Multi-resolution Signal Decomposition (MSD) technique of wavelet transform. This technique has showed off interesting properties in capturing the embedded horizontal, vertical and diagonal variations within an image obtained from the PD pattern in a separable form. This feature was exploited to identify in the PD pattern's MSD, relative at various family of partial discharge sources, some detail images typical of a single discharge phenomenon. The classification of a generic PD phenomenon is feasible through a comparison between its detail images and the detail images typical of a single discharge phenomenon. Tests have been performed on specimens having single defects. The obtained results prove that the proposed improved classification methods is quite efficient and accurate. ©2006 IEEE.
Lingua originaleEnglish
Numero di pagine4
Stato di pubblicazionePublished - 2007

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Materials Chemistry

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