A Simple Apparatus for the Determination of the Optical Constants and the Thickness of Absorbing Thin Films

Risultato della ricerca: Articlepeer review

8 Citazioni (Scopus)

Abstract

We report on a simple and inexpensive apparatus useful for measuring the optical constants n, k and the thickness of weakly absorbing thin films. The measurement is based on an accurate determination of the reflectance and transmittance of a specimen illuminated by a laser beam. The laser beam is incident on a transparent substrate coated with the film to be evaluated, with an angle of incidence equal to the Brewster angle for the substrate, and its polarization can be switched between the p and s states. If the thickness is known to be within a presumptive range, measurements of the p and s reflectance and transmittance allow a calculation of the optical constants n, k and the thickness of the film, provided the absorption is weak.
Lingua originaleEnglish
pagine (da-a)295-298
Numero di pagine4
RivistaOptics Communications
Volume191
Stato di pubblicazionePublished - 2001

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Physical and Theoretical Chemistry
  • Electrical and Electronic Engineering

Fingerprint Entra nei temi di ricerca di 'A Simple Apparatus for the Determination of the Optical Constants and the Thickness of Absorbing Thin Films'. Insieme formano una fingerprint unica.

Cita questo