Abstract
A methodology developed for active testing of electronic devices under radiations is presented. The test setup includes a gamma-ray facility, hardware board/fixtures and software tools purposely designed and realized. The methodology is so wide-ranging to allow us the verification of different classes of electronic devices, even if only application examples for Static Random Access Memory (SRAM) modules are reported.
Lingua originale | English |
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pagine (da-a) | 53-60 |
Numero di pagine | 8 |
Rivista | NUCLEAR TECHNOLOGY & RADIATION PROTECTION |
Volume | 33 |
Stato di pubblicazione | Published - 2018 |
All Science Journal Classification (ASJC) codes
- ???subjectarea.asjc.2100.2104???
- ???subjectarea.asjc.2200.2213???