A methodology for Active Testing of Electronic Devices under Radiations

Aldo Parlato, Elio Angelo Tomarchio, Calogero Pace, Cristiano Calligaro, Aldo Parlato

Risultato della ricerca: Articlepeer review

2 Citazioni (Scopus)

Abstract

A methodology developed for active testing of electronic devices under radiations is presented. The test setup includes a gamma-ray facility, hardware board/fixtures and software tools purposely designed and realized. The methodology is so wide-ranging to allow us the verification of different classes of electronic devices, even if only application examples for Static Random Access Memory (SRAM) modules are reported.
Lingua originaleEnglish
pagine (da-a)53-60
Numero di pagine8
RivistaNUCLEAR TECHNOLOGY & RADIATION PROTECTION
Volume33
Stato di pubblicazionePublished - 2018

All Science Journal Classification (ASJC) codes

  • Nuclear Energy and Engineering
  • Safety, Risk, Reliability and Quality

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