A methodology for Active Testing of Electronic Devices under Radiations

Aldo Parlato; Elio Angelo Tomarchio; Calogero Pace; Cristiano Calligaro; Aldo Parlato

A methodology for Active Testing of Electronic Devices under Radiations

Aldo Parlato, Elio Angelo Tomarchio, Calogero Pace, Cristiano Calligaro, Aldo Parlato

Risultato della ricerca: Article › peer review

Abstract

A methodology developed for active testing of electronic devices under radiations is presented. The test setup includes a gamma-ray facility, hardware board/fixtures and software tools purposely designed and realized. The methodology is so wide-ranging to allow us the verification of different classes of electronic devices, even if only application examples for Static Random Access Memory (SRAM) modules are reported.

Lingua originale	English
pagine (da-a)	53-60
Numero di pagine	8
Rivista	NUCLEAR TECHNOLOGY & RADIATION PROTECTION
Volume	33
Stato di pubblicazione	Published - 2018

All Science Journal Classification (ASJC) codes

Nuclear Energy and Engineering
Safety, Risk, Reliability and Quality

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title = "A methodology for Active Testing of Electronic Devices under Radiations",

abstract = "A methodology developed for active testing of electronic devices under radiations is presented. The test setup includes a gamma-ray facility, hardware board/fixtures and software tools purposely designed and realized. The methodology is so wide-ranging to allow us the verification of different classes of electronic devices, even if only application examples for Static Random Access Memory (SRAM) modules are reported.",

author = "Aldo Parlato and Tomarchio, {Elio Angelo} and Calogero Pace and Cristiano Calligaro and Aldo Parlato",

year = "2018",

language = "English",

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T1 - A methodology for Active Testing of Electronic Devices under Radiations

AU - Parlato, Aldo

AU - Tomarchio, Elio Angelo

AU - Pace, Calogero

AU - Calligaro, Cristiano

AU - Parlato, Aldo

PY - 2018

Y1 - 2018

N2 - A methodology developed for active testing of electronic devices under radiations is presented. The test setup includes a gamma-ray facility, hardware board/fixtures and software tools purposely designed and realized. The methodology is so wide-ranging to allow us the verification of different classes of electronic devices, even if only application examples for Static Random Access Memory (SRAM) modules are reported.

AB - A methodology developed for active testing of electronic devices under radiations is presented. The test setup includes a gamma-ray facility, hardware board/fixtures and software tools purposely designed and realized. The methodology is so wide-ranging to allow us the verification of different classes of electronic devices, even if only application examples for Static Random Access Memory (SRAM) modules are reported.

UR - http://hdl.handle.net/10447/353494

UR - http://ntrp.vinca.rs/2018_1/Parlato_2018_1.pdf

M3 - Article

VL - 33

SP - 53

EP - 60

JO - NUCLEAR TECHNOLOGY & RADIATION PROTECTION

JF - NUCLEAR TECHNOLOGY & RADIATION PROTECTION

SN - 1451-3994

ER -