A methodology developed for active testing of electronic devices under radiations is presented. The test setup includes a gamma-ray facility, hardware board/fixtures and software tools purposely designed and realized. The methodology is so wide-ranging to allow us the verification of different classes of electronic devices, even if only application examples for Static Random Access Memory (SRAM) modules are reported.
|Numero di pagine||8|
|Rivista||NUCLEAR TECHNOLOGY & RADIATION PROTECTION|
|Stato di pubblicazione||Published - 2018|
All Science Journal Classification (ASJC) codes
- Nuclear Energy and Engineering
- Safety, Risk, Reliability and Quality