A knowledge-based exploratory framework to study quality of Italian Mobile Telecommunication Services

Toni Lupo, Seyyed Ali Delbari

Risultato della ricerca: Article

2 Citazioni (Scopus)

Abstract

A novel two-step knowledge-based exploratory framework is proposed in this paper for studying quality of Italian Mobile Telecommunication Services (MTSs). Particularly, the Delphi technique is initially considered to finalize an overall quality structure of MTSs features, indicators and drivers, herein described on the basis of a comprehensive review of the fundamental references for the field, and also to select the key elements with reference to the Italian context. At the second step, selected key elements are prioritized via the Analytic Hierarchical Process (AHP) method according to viewpoints of the fundamental stakeholders for the sector. Furthermore, possible uncertainty and ambiguity of involved experts at this step of the study are addressed via a linguistic comparison scale represented by fuzzy numbers. Results of the first step revealed that the quality structure of Italian MTSs includes 15 key indicators with reference to four key MTSs quality features and 7 key drivers. On the other hand, results of the second step pointed out that tangible aspects represents the fundamental key MTSs quality feature, whereas network population coverage, price of data services, and internet network performance represent the crucial key indicators. In addition, technological resources and technological innovation as well as informational resources constitute the most important key quality drivers of Italian MTSs. Obtained results may be of interest for MTSs managers and decision makers as well researchers of the field offering important suggestions as to how to evaluate and improve quality of MTSs
Lingua originaleEnglish
pagine (da-a)129-144
Numero di pagine16
RivistaTelecommunication Systems
Volume68
Stato di pubblicazionePublished - 2018

    Fingerprint

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

Cita questo