29Si Hyperfine structure of the E’_alfa center in amorphous silicon dioxide

Risultato della ricerca: Articlepeer review

32 Citazioni (Scopus)

Abstract

We report a study by electron paramagnetic resonance on the E0 point defect in amorphous silicondioxide (a-SiO2). Our experiments were performed on -ray irradiated oxygen-deficient materials andpointed out that the 29Si hyperfine structure of the E0 consists of a pair of lines split by 49 mT. On thebasis of the experimental results, a microscopic model is proposed for the E0 center, consisting of a holetrapped in an oxygen vacancy with the unpaired electron sp3 orbital pointing away from the vacancy in aback-projected configuration and interacting with an extra oxygen atom of the a-SiO2 matrix.
Lingua originaleEnglish
pagine (da-a)1-4
Numero di pagine4
RivistaPhysical Review Letters
Volume97
Stato di pubblicazionePublished - 2006

All Science Journal Classification (ASJC) codes

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