Threshold Voltage Variability of NROM Memories After Exposure to Ionizing Radiation

Fabio Principato, Calogero Pace, Salvatore A. Lombardo, Domenico Corso, Michael Lisiansky, Yakov Roizin, Sebania Libertino, Paolo Finocchiaro, Felix Palumbo

Research output: Contribution to journalArticlepeer-review

3 Citations (Scopus)

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Engineering & Materials Science

Chemical Compounds