Thickness measurement of soft thin films on periodically patterned magnetic substrates by phase difference magnetic force microscopy

Francesco Ciccarello, Natalizi, Rossi, Dong, Angeloni, Marianecci, Pantanella, Berlutti, Passeri

Research output: Contribution to journalArticlepeer-review

17 Citations (Scopus)
Original languageEnglish
Pages (from-to)96-106
Number of pages11
Publication statusPublished - 2014

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Instrumentation

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