Structural and in situ vibrational study of luminescent cluster assembled silicon thin films

Bruno Giuseppe Pignataro, Alessandro A. Scalisi, Luisa D'Urso, Orazio Puglisi, Giuseppe Compagnini

Research output: Contribution to journalArticlepeer-review

3 Citations (Scopus)

Abstract

A Low Energy Cluster Beam Deposition apparatus is employed to produce cluster assembled silicon thin films (1-500 nm thick) by using a laser vaporization source. The generated clusters are studied since their formation through time of flight mass spectra and the calculated size in the gas phase are compared with those of the deposited aggregates obtained through Dynamic Scanning Force Microscopy. The deposited material is also studied "in situ" by Raman and infrared spectroscopy. The spectra reveal that the as deposited clusters are hydrogenated with negligible amount of oxide. A comparison of the film properties before and after their air exposure shows that the exposition induces a consistent oxidation, leading to a near-infrared luminescent silicon nanoparticles surrounded by SiOx shells.
Original languageEnglish
Pages (from-to)343-347
Number of pages5
JournalThin Solid Films
Volume495
Publication statusPublished - 2006

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Metals and Alloys
  • Materials Chemistry

Fingerprint

Dive into the research topics of 'Structural and in situ vibrational study of luminescent cluster assembled silicon thin films'. Together they form a unique fingerprint.

Cite this