Outlier analysis and principal component analysis to detect fatigue cracks in waveguides

Marcello Cammarata, Marcello Cammarata, Piervincenzo Rizzo, Debaditya Dutta, Hoon Sohn

    Research output: Contribution to conferenceOther

    Original languageEnglish
    Number of pages8
    Publication statusPublished - 2009

    All Science Journal Classification (ASJC) codes

    • Electronic, Optical and Magnetic Materials
    • Condensed Matter Physics
    • Computer Science Applications
    • Applied Mathematics
    • Electrical and Electronic Engineering

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